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Infineon Technologies AG
 

PULSIV
 

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19.09.2026 11:04:41
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Anritsu Helps Engineers Validate Optical and Digital Infrastructure for the AI Generation at ECOC 2026
Application-focused demonstrations for high-speed digital, optical, and virtualized network validation.

ANRITSU CORPORATION will join ECOC 2026 in Malaga, Spain, September 21-23, to show how engineers can validate the critical technologies behind faster, denser, and more resilient optical and digital networks. As AI, cloud services, data centers, and edge applications increase demands on speed, density, latency, and service assurance, Anritsu will demonstrate application-focused test solutions that help reduce design risk, accelerate troubleshooting and manufacturing, and support more confident deployment across increasingly complex infrastructures.
Through live measurements and application-led demonstrations, visitors will learn how to improve validation accuracy, shorten debug cycles, extend performance visibility and verify network quality from R&D and manufacturing through to field installation, maintenance and service assurance.

Simplifying PCIe 7.0 Receiver Testing
Anritsu will demonstrate its PCI Express® 7.0 receiver test solution based on the Signal Quality Analyzer-R MP1900A, showcasing 128 GT/s PAM4 signal for next-generation high-speed interface validation. The demonstration will highlight signal generation and detection after typical PCIe lossy connections, helping engineers understand how to simplify increasingly complex PCIe Gen 7.0 receiver testing while improving confidence in compliance-ready designs for AI data center and high-performance computing applications.

Driving Next-Generation Optical Modulators and Electrical Devices with Higher Signal Fidelity
Anritsu will showcase its new AH15203A/B 140 Gbaud Wideband Linear Amplifier with integrated bias tee, designed to support the characterization of next-generation high-speed optical and electrical devices. With a broad frequency response up to 125 GHz, 2.0 Vpp output, and low jitter performance, the amplifier enables engineers to faithfully drive and evaluate optical modulators for emerging 800GbE, 1.6TbE, and Beyond-1Tb transmission systems. This new amplifier highlights how Anritsu helps accelerate the development of faster, more reliable data center and network infrastructure.

Accelerating CXL Device and Memory Validation
Anritsu will present a new CXL® 2.0/3.x test option for the Signal Quality Analyzer-R MP1900A. Designed to support the evaluation of CXL-enabled devices and memories, the option enables engineers to create and execute normal, abnormal, and stress test scenarios more efficiently. By helping isolate physical-layer signal integrity issues earlier, it reduces debug time, improves evaluation confidence, and supports faster development of next-generation high-speed designs.

Precision Testing for the Next Era of Optical Networks
Experience a technology demonstration of Anritsu’s latest 60 GHz optical sampling oscilloscope solution, showing how it supports accurate, standards-compliant evaluation of 200G/lane and 1.6T optical transceivers. The technology demo will highlight how engineers can capture high-speed PAM4 signal behavior, validate key optical parameters such as TDECQ, and streamline multi-lane transceiver testing for next-generation AI data center infrastructure.
The BERTWave MP2110A is an all-in-one instrument with built-in BERT (Bit Error Rate Tester) and Sampling Oscilloscope (Eye pattern, waveform and TDECQ analysis) designed for system testing and manufacturing inspection of 10G to 1.6T optical modules.

Characterizing Opto-Electronic Devices up to 170 GHz
The explosive growth of AI workloads is accelerating the transition to 224 Gbps and 448 Gbps per lane optical interconnects, placing unprecedented demands on device characterization and measurement accuracy. Anritsu will demonstrate an ultra-high-frequency opto-electronic measurement solution combining VectorStar™ ME7838G 220 GHz broadband VNA, MN4765B O/E Reference Calibration Module and MN4775A E/O to deliver the world’s fastest traceable solution up to 170 GHz. The live demonstration will show how engineers can accurately characterize next-generation silicon photonics, co-packaged optics, modulators, and photodetectors with uncompromised measurement confidence, helping drive the development of 1.6T and 3.2T optical networks for AI data centers.

Anritsu will also participate in a joint demonstration at SmarAct stand 2132, showing how modular components can be combined into flexible, application-specific equipment for PIC characterization. Built for machine builders and system integrators, the demonstrator highlights a practical route to creating scalable photonics test solutions for R&D, validation, and production, without locking users into a closed turnkey system. An Anritsu vector network analyzer will be used to capture the electro-optical response as part of the live setup.

Evaluating Multi-Core Fiber for Higher-Capacity Networks
With AI, cloud services, submarine cables, and data center interconnects driving demand for higher transmission capacity, R&D is increasingly focused on weakly coupled multi-core optical fibers with multiple independent cores. Anritsu will demonstrate the MT9100A Multi Channel Fiber Tester  evaluation solution using advanced OTDR technology to perform live measurements on a four-core weakly coupled fiber with a standard 125 µm cladding diameter.
The demonstration highlights measurement methodologies for higher-capacity optical networks, supporting use cases from R&D and manufacturing to field installation and maintenance. It is enabled through collaboration with key ecosystem partners, with Heraeus Covantics Denmark providing the multi-core optical fiber and Chiral Photonics supplying multi-core fiber fan-in/fan-out devices for accurate individual core access and end-to-end evaluation.

Extending Network Quality Testing into Virtual and Cloud Environments
Anritsu’s Virtual Network Master (vTester) enables engineers to validate throughput, latency, jitter, frame loss, and key QoS parameters across virtualized, mobile, and cloud-integrated networks, extending performance visibility into locations where hardware-based test equipment cannot be deployed. Anritsu will demonstrate how vTester can operate between software instances or in combination with the Network Master MT1000A to assess fixed, mobile, and 5G/LTE networks under full-load conditions, helping engineers troubleshoot faster, verify SLA performance, and scale service assurance across data center, transport, and edge environments.

Visitors to ECOC 2026 can meet Anritsu’s experts at stand 2075 from 21 to 23 September.

2026091201 / 12.09.2026 / Veletrhy, výstavy, akce / ANRITSU /

Anritsu Helps Engineers Validate Optical and Digital Infrastructure for the AI Generation at ECOC 2026
Application-focused demonstrations for high-speed digital, optical, and virtualized network validation.

Anritsu Introduces Modular 2-port VNAs that Combine Performance, Ease-of-Use and Cost Advantages at Frequencies Up to 43.5 GHz
New ME7869A Series Conducts Long-distance, Full Vector S-parameter Measurements Over Distances Up To 100 Meters

Signal Quality Analyzer-R MP1900A Supports PCI Express® 6.0 Base Specification Rx Test
Anritsu Corporation (President Hirokazu Hamada) is pleased to announce that its Signal Quality Analyzer-R MP1900A now supports the PCI Express®6.0 (PCIe®6.0) Base Specification Receiver Test (Rx Test).

Anritsu Adds IQ Capture, Streaming Capability to Field Master Pro™ MS2090A RTSA
New Options Combine with Best-in-Class Wide Bandwidth, Long Memory, and Fast Transfer Speed to Provide Comprehensive Signal Analysis in General Purpose Applications

Evropská roadshow Anritsu “Spektrální analýza” v březnu 2018 v České republice
Rychlý rozvoj současných radiových technologií a rostoucí požadavky na měření přinášejí nové výzvy a my pomáháme inženýrům a technikům tyto úkoly řešit


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electronica 2024, 12.11.-15.11.2024, Munich, DE

Adresář


Vox Power


Texas Instruments


STMicroelectronics


Future Electronics


TELEDYNE Vision Solution


Mitsubishi Electric


Parker Hannifin


QUECTEL


Infineon Technologies AG


PULSIV


MikroElektronika d.o.o.


Cambridge GaN Devices


Traco Power


BALLUFF


Seica


PEI-Genesis


KEYENCE


CML Microcircuits


SAMTEC


ams-OSRAM


INTEL


TDK Corporation


Giada


RS group


NOKIA


ANRITSU


HARWIN


Digi-Key Electronics


AERS


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Kalendář
electronica 2026, München, DE, 10.-13.11.2026

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